IEC 60512-25-6:2004
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
Connecteurs pour équipements électroniques - Essais et mesures - Partie 25-6: Essai 25f: Diagramme de l'oeil et gigue
Describes methods for measuring an eye pattern response and jitter in the time domain.


To use the preview feature, please enable JavaScript in your Browser


PDF document (download version)
ZIP file (download version)
Paper (print version)/shipping item
E-book (Adobe DRM ePub)
Storage medium
Database
Viewing access (7-days available online)
Mandatory Standard according current regulation