IEC 60749-36:2003

Title

Language: EN Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Language: FR Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 36: Accélération constante

Abstract

Language: EN Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
13.02.2003
TC 47
ICS Codes
31.080.01
Publication number
60749
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€ 9,10 (Download and hardcopy)
Delivery format
postal download (7 Pages)

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