IEC TS 62916:2017

Title

Language: EN Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing

Abstract

Language: EN IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.

Language(s)
Language: EN
Edition
1.0
Date of issue
10.04.2017
TC 82
ICS Codes
27.160
Publication number
62916
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