IEC 61580-9:1996

Title

Language: EN Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

Language: FR Méthodes de mesure applicables aux guides d'ondes - Partie 9: Coefficient de réflexion aux interfaces des guides d'ondes

Abstract

Language: EN Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
03.07.1996
TC 46/SC 46F
ICS Codes
17.220.20, 33.120.10
Publication number
61580
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