IEC 60749-2:2002/COR1:2003

Title

Language: EN Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

Language: FR Corrigendum 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 2: Basse pression atmosphérique

Abstract

Language: EN Modification of the validity date: now put at 2007.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
12.08.2003
TC 47
ICS Codes
31.080.01
Publication number
60749
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