IEC 60749-23:2004

Title

Language: EN Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Language: FR Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 23 : Durée de vie en fonctionnement à haute température

Abstract

Language: EN This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
23.02.2004
TC 47
ICS Codes
31.080.01
Publication number
60749
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€ 36,40 (Download and hardcopy)
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