IEC 62525:2007

Title

Language: EN Standard Test Interface Language (STIL) for Digital Test Vector Data

Abstract

Language: EN Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

Language(s)
Language: EN
Edition
1.0
Date of issue
07.11.2007
TC 91
ICS Codes
25.040.01, 19.080
Publication number
62525
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€ 300,00 (Download and hardcopy)
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postal download (143 Pages)

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