IEC 61445:2012

Title

Language: EN Digital Test Interchange Format (DTIF)

Abstract

Language: EN IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following: a) UUT Model; b) Stimulus and Response; c) Fault Dictionary; d) Probe.

Language(s)
Language: EN
Edition
1.0
Date of issue
21.06.2012
TC 91
ICS Codes
25.040.01, 35.060
Publication number
61445
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€ 290,90 (Download and hardcopy)
Delivery format
postal download (101 Pages)

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