IEC TR 62878-2-2:2015

Title

Language: EN Device embedded substrate - Part 2-2: Guidelines - Electrical testing

Language: FR Substrat avec appareil(s) integre(s) - Partie 2-2: Directives - Essai électrique

Abstract

Language: EN IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
04.12.2015
TC 91
ICS Codes
31.180, 31.190
Publication number
62878
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