IEC 60444-2:1980

Title

Language: EN Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Language: FR Mesure des paramètres des quartz piézoélectriques par la technique de phase nulle dans le circuit en pi. Deuxième partie: Méthode de décalage de phase pour la mesure de la capacité dynamique des quartz

Abstract

Language: EN Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
01.01.1980
TC 49
ICS Codes
31.140
Publication number
60444
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