IEC 60748-20-1:1994

Title

Language: EN Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination

Language: FR Dispositifs à semiconducteurs - Circuits intégrés - Partie 20: Spécification générique pour les circuits intégrés à couches et les circuits intégrés hybrides à couches - Section 1: Exigences pour l'examen visuel interne

Abstract

Language: EN The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier, respectively.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
01.03.1994
TC
TC 47/SC 47A
ICS Codes
31.200
Publication number
60748
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Mandatory Standard according current regulation Mandatory Standard according current regulation

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