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IEC 60748-20-1:1994

Title

Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination

Dispositifs à semiconducteurs - Circuits intégrés - Partie 20: Spécification générique pour les circuits intégrés à couches et les circuits intégrés hybrides à couches - Section 1: Exigences pour l'examen visuel interne

Abstract

The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier, respectively.

Language(s)

Edition

1.0

Date of issue

01.03.1994

TC

TC 47/SC 47A

ICS Codes

31.200

Publication number

60748

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Price (excl. VAT)

€ 154,50 (Download and hardcopy)

Delivery format

(55 Pages)

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