IEC 60749-43:2017

Title

Language: EN Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

Language: FR Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43: Lignes directrices concernant les plans de qualification de la fiabilité des CI

Abstract

Language: EN IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
15.06.2017
TC 47
ICS Codes
31.080.01
Publication number
60749
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Price (excl. VAT)
€ 181,80 (Download and hardcopy)
Delivery format
postal download (74 Pages)

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