IEC 60759:1983

Title

Language: EN Standard test procedures for semiconductor X-ray energy spectrometers

Language: FR Méthodes d'essais normalisés des spectromètres d'énergie X à semicteur

Abstract

Language: EN Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
01.01.1983
TC
TC 45
ICS Codes
17.240
Publication number
60759
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Mandatory Standard according current regulation Mandatory Standard according current regulation

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