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IEC 60759:1983

Title

Standard test procedures for semiconductor X-ray energy spectrometers

Méthodes d'essais normalisés des spectromètres d'énergie X à semicteur

Abstract

Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

Language(s)

Edition

1.0

Date of issue

01.01.1983

TC

TC 45

ICS Codes

17.240

Publication number

60759

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Price (excl. VAT)

€ 218,20 (Download and hardcopy)

Delivery format

(97 Pages)

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