IEC 60749-18:2002

Title

Language: EN Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Language: FR Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 18: Rayonnements ionisants (dose totale)

Abstract

Language: EN Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
13.12.2002
TC 47
ICS Codes
31.080.01
Publication number
60749
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€ 63,60 (Download and hardcopy)
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postal download (27 Pages)

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