IEC 62979:2017

Title

Language: EN Photovoltaic modules - Bypass diode - Thermal runaway test

Abstract

Language: EN IEC 62979:2017(E) provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.

Language(s)
Language: EN
Edition
1.0
Date of issue
10.08.2017
TC 82
ICS Codes
27.160
Publication number
62979
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Mandatory Standard according current regulation Mandatory Standard according current regulation

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