IEC PAS 62162:2000

Title

Language: EN Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

Abstract

Language: EN Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.

Language(s)
Language: EN
Edition
1.0
Date of issue
22.08.2000
TC 47
ICS Codes
31.080.01
Publication number
62162
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