IEC 62416:2010

Title

Language: EN Semiconductor devices - Hot carrier test on MOS transistors

Language: FR Dispositifs à semiconducteurs - Essai de porteur chaud sur les transistors MOS

Abstract

Language: EN IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
26.04.2010
TC 47
ICS Codes
31.080.30
Publication number
62416
Preview

To use the preview feature, please enable JavaScript in your Browser


Price (excl. VAT)
€ 36,40 (Download and hardcopy)
Delivery format
postal download (20 Pages)

Warenkorb

Back

Legend

Document for download (PDF) PDF document (download version)
ZIP File for download ZIP file (download version)
Shipping item Paper (print version)/shipping item
Adobe DRM ePub File E-book (Adobe DRM ePub)
Storage medium Storage medium
Database Database
Bezugsart Online Viewing access (7-days available online)
Mandatory Standard according current regulation Mandatory Standard according current regulation

This website uses cookies. By continuing to use this website you are giving consent to cookies being used. For information on cookies, please look at our privacy statement.