IEC 60749-30:2005/AMD1:2011

Title

Language: EN Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Language: FR Amendement 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 30: Préconditionnement des composants pour montage en surface non hermétiques avant les essais de fiabilité

Abstract

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Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
25.05.2011
TC
TC 47
ICS Codes
31.080.01
Publication number
60749
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Mandatory Standard according current regulation Mandatory Standard according current regulation

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