IEC 62435-2:2017

Title

Language: EN Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

Language: FR Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 2: Mécanismes de détérioration

Abstract

Language: EN IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
24.01.2017
TC 47
ICS Codes
31.020
Publication number
62435
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