IEC 61788-17:2013

Title

Language: EN Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films

Language: FR Supraconductivité - Partie 17: Mesures de caractéristiques électroniques - Densité de courant critique local et sa distribution dans les films supraconducteurs de grande surface

Abstract

Language: EN IEC 61788-17:2013 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are from 200 A/m to 32 kA/m, with a measurement resolution of 100 A/m.

Language(s)
Language: EN Language: FR
Edition
1.0
Date of issue
16.01.2013
TC 90
ICS Codes
17.220.20, 29.050
Publication number
61788
Preview

To use the preview feature, please enable JavaScript in your Browser


Price (excl. VAT)
€ 218,20 (Download and hardcopy)
Delivery format
postal download (93 Pages)

Warenkorb

Back

Legend

Document for download (PDF) PDF document (download version)
ZIP File for download ZIP file (download version)
Shipping item Paper (print version)/shipping item
Adobe DRM ePub File E-book (Adobe DRM ePub)
Storage medium Storage medium
Database Database
Bezugsart Online Viewing access (7-days available online)
Mandatory Standard according current regulation Mandatory Standard according current regulation

This website uses cookies. By continuing to use this website you are giving consent to cookies being used. For information on cookies, please look at our privacy statement.