IEC 62526:2007

Title

Language: EN Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Abstract

Language: EN Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.

Language(s)
Language: EN
Edition
1.0
Date of issue
07.11.2007
TC 91
ICS Codes
25.040.01
Publication number
62526
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€ 300,00 (Download and hardcopy)
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postal download (123 Pages)

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